Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/22384
Title: Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective
Authors: Sukhikh, Leonid Grigorievich
Artyukov, Igor
Bajt, Sasa
Kube, Gero
Lauth, Werner
Potylitsyn, Alexander Petrovich
Vukolov, Artem Vladimirovich
Keywords: измерения; свет; переходные излучения; изображения; пучки; электронные ускорители
Issue Date: 2015
Citation: Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective / L. G. Sukhikh [et al.] // RREPS-15. Radiation from Relativistic Electrons in Periodic Structures : XI International Symposium, 6-11 September 2015, Saint Petersburg, Russia. — Tomsk : TPU Publishing House, 2015. — [P. 88].
URI: http://earchive.tpu.ru/handle/11683/22384
Appears in Collections:Материалы конференций

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