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Название: Fractography of Fatigue Fracture Surface in Silumin Subjected to Electron-Beam Processing
Авторы: Konovalov, S. V.
Aksenova, K. V.
Gromov, V. E.
Ivanov, Yuriy Fedorovich
Semina, O. A.
Ключевые слова: фрактография; усталостные разрушения; поверхности; силумины; электронно-лучевая обработка
Дата публикации: 2016
Издатель: IOP Publishing
Библиографическое описание: Fractography of Fatigue Fracture Surface in Silumin Subjected to Electron-Beam Processing / S. V. Konovalov [et al.] // IOP Conference Series: Materials Science and Engineering. — 2016. — Vol. 142 : Innovative Technologies in Engineering : VII International Scientific Practical Conference, 19–21 May 2016, Yurga, Russian Federation : [proceedings]. — [012080, 6 p.].
Аннотация: The surface modification of the eutectic silumin with high-intensity pulsed electron beam has been carried out. Multi-cycle fatigue tests were performed and irradiation mode made possible the increase in the silumin fatigue life more than 3.5 times was determined. Studies of the structure of the surface irradiation and surface fatigue fracture of silumin in the initial (unirradiated) state and after modification with intense pulsed electron beam were carried out by methods of scanning electron microscopy. It has been shown, that in mode of partial melting of the irradiation surface the modification process of silicon plates is accompanied by the formation of numerous large micropores along the boundary plate/matrix and microcracks located in the silicon plates. A multi-modal structure (grain size within 30-50 μm with silicon particles up to 10 [mu]m located on the boundaries) is formed in stable melting mode, as well as subgrain structure in the form of crystallization cells from 100 to 250 [mu]m in size). Formation of a multi-modal, multi-phase, submicro- and nanosize structure assisting to a significant increase in the critical length of the crack, the safety coefficient and decrease in step of cracks for loading cycle was the main cause for the increase in silumin fatigue life.
URI: http://earchive.tpu.ru/handle/11683/34755
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