Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/18081
Title: Detection and defect correction of operating process
Authors: Vasendina, Elena Aleksandrovna
Plotnikova, Inna Vasilievna
Levitskaya, Anastasiya
Kvesko, Svetlana
Keywords: обнаружение; исправление; дефекты; производство; параметры; конкурентоспособность; древесно-стружечные плиты
Issue Date: 2016
Publisher: IOP Publishing
Citation: Detection and defect correction of operating process / E. A. Vasendina [et al.] // IOP Conference Series: Materials Science and Engineering. — 2016. — Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015) : International Scientific Conference, 31 August to 10 September 2015, Tomsk, Russia : [proceedings]. — [012070, 4 p.].
Abstract: The article is devoted to the current problem of enterprise competitiveness rise in hard and competitive terms of business environment. The importance of modern equipment for detection of defects and their correction is explained. Production of chipboard is used as an object of research. Short description and main results of estimation efficiency of innovative solutions of enterprises are considered.
URI: http://earchive.tpu.ru/handle/11683/18081
Appears in Collections:Материалы конференций

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