Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/38193
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dc.contributor.authorSirenko, M. A.en
dc.contributor.authorTarasenko, P. F.en
dc.contributor.authorPushkarev, Maksim Ivanovichen
dc.date.accessioned2017-04-28T07:15:33Z-
dc.date.available2017-04-28T07:15:33Z-
dc.date.issued2017-
dc.identifier.citationSirenko M. A. Finite-sample and asymptotic sign-based tests for parameters of non-linear quantile regression with Markov noise / M. A. Sirenko, P. F. Tarasenko, M. I. Pushkarev // Journal of Physics: Conference Series. — 2017. — Vol. 803 : Information Technologies in Business and Industry (ITBI2016) : International Conference, 21–26 September 2016, Tomsk, Russian Federation : [proceedings]. — [012150, 7 p.].en
dc.identifier.urihttp://earchive.tpu.ru/handle/11683/38193-
dc.description.abstractOne of the most noticeable features of sign-based statistical procedures is an opportunity to build an exact test for simple hypothesis testing of parameters in a regression model. In this article, we expanded a sing-based approach to the nonlinear case with dependent noise. The examined model is a multi-quantile regression, which makes it possible to test hypothesis not only of regression parameters, but of noise parameters as well.en
dc.language.isoenen
dc.publisherIOP Publishingen
dc.relation.ispartofJournal of Physics: Conference Series. Vol. 803 : Information Technologies in Business and Industry (ITBI2016). — Bristol, 2017.en
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.subjectтестыru
dc.subjectрегрессииru
dc.subjectшумыru
dc.subjectтестированиеru
dc.subjectстатистические процедурыru
dc.titleFinite-sample and asymptotic sign-based tests for parameters of non-linear quantile regression with Markov noiseen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.typeinfo:eu-repo/semantics/conferencePaperen
dcterms.audienceResearchesen
local.departmentНациональный исследовательский Томский политехнический университет (ТПУ)::Институт кибернетики (ИК)::Кафедра автоматики и компьютерных систем (АИКС)ru
local.description.firstpage12150-
local.filepathhttp://dx.doi.org/10.1088/1742-6596/803/1/012150-
local.identifier.bibrecRU\TPU\network\20036-
local.identifier.colkeyRU\TPU\col\18698-
local.identifier.perskeyRU\TPU\pers\30702-
local.localtypeДокладru
local.volume8032016-
local.conference.nameInformation Technologies in Business and Industry (ITBI2016)-
local.conference.date2016-
dc.identifier.doi10.1088/1742-6596/803/1/012150-
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