Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/47010
Full metadata record
DC FieldValueLanguage
dc.contributor.authorYermoshin, N. I.en
dc.contributor.authorYakimov, Evgeny Valeryevichen
dc.date.accessioned2018-03-29T08:57:15Z-
dc.date.available2018-03-29T08:57:15Z-
dc.date.issued2018-
dc.identifier.citationYermoshin N. I. Feasibility of using T-shaped feedback in teraohmmeters / N. I. Yermoshin, E. V. Yakimov // IOP Conference Series: Materials Science and Engineering. — 2018. — Vol. 289 : Modern Technologies for Non-Destructive Testing : 6th International Conference, 9–14 October 2017, Tomsk, Russian Federation : [proceedings]. — [012008, 6 p.].en
dc.identifier.urihttp://earchive.tpu.ru/handle/11683/47010-
dc.description.abstractThe paper investigates the feasibility of using T-shaped feedback in teraohmmeters. Theoretical and experimental dependences of the output voltage of the T-shaped feedback converter on the measured resistance and circuit parameters are obtained. The use of T-shaped feedback is found to decrease the reference resistance rating from 10 GOhm to 100 Ohm that indicates 100-fold reduction (with an error of less than 1%).en
dc.language.isoenen
dc.publisherIOP Publishingru
dc.relation.ispartofIOP Conference Series: Materials Science and Engineering. Vol. 289 : Modern Technologies for Non-Destructive Testing. — Bristol, 2018.en
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.subjectобратная связьru
dc.subjectтераомметрыru
dc.subjectвыходное напряжениеru
dc.subjectизоляцияru
dc.subjectэлектрооборудованиеru
dc.subjectизоляционные материалыru
dc.subjectдефектыru
dc.titleFeasibility of using T-shaped feedback in teraohmmetersen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.typeinfo:eu-repo/semantics/conferencePaperen
dcterms.audienceResearchesen
local.description.firstpage12008-
local.filepathhttp://dx.doi.org/10.1088/1757-899X/289/1/012008-
local.identifier.bibrecRU\TPU\network\24320-
local.identifier.perskeyRU\TPU\pers\31173-
local.localtypeДокладru
local.volume289-
local.conference.nameModern Technologies for Non-Destructive Testing-
local.conference.date2017-
dc.identifier.doi10.1088/1757-899X/289/1/012008-
Appears in Collections:Материалы конференций

Files in This Item:
File SizeFormat 
dx.doi.org-10.1088-1757-899X-289-1-012008.pdf319,07 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.