Please use this identifier to cite or link to this item:
http://earchive.tpu.ru/handle/11683/33545| Title: | PIN-diode diagnostics of pulsed electron beam for high repetition rate mode |
| Authors: | Egorov, Ivan Sergeevich Remnev, Gennady Efimovich And Xiao Yu |
| Keywords: | диоды; диагностика; импульсные пучки; электронные пучки; частоты |
| Issue Date: | 2016 |
| Citation: | Egorov I. S. PIN-diode diagnostics of pulsed electron beam for high repetition rate mode / I. S. Egorov, G. E. Remnev, And Xiao Yu // Energy Fluxes and Radiation Effects (EFRE-2016) : International Congress, October 2–7, 2016, Tomsk, Russia : abstracts. — Tomsk : TPU Publishing House, 2016. — [P. 40]. |
| URI: | http://earchive.tpu.ru/handle/11683/33545 |
| Appears in Collections: | Материалы конференций |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| conference_tpu-2016-C117_p41.pdf | 241,23 kB | Adobe PDF | View/Open |
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