Influence of heating temperature on the aluminum used for electric cables

Abstract

In this study, we present the effects of temperature rise on microstructural evolution of industrial Al wire. This material is used to manufacture electric cables. For the X-ray analysis of the line profile (LPA), we have chosen the so-called «breadth method» whose basic principle is to draw the Williamson-Hall plot. We have observed that the increase in temperature causes the increasing of coherent diffraction domains (crystallites) size, interplanar distance and cell parameter. There is an expansion of the unit cell. XRD patterns refinement were performed using the whole powder pattern modelling procedure implemented in PM2k software.