Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/58020
Title: Measurement of 1-GeV Electrons Ionization loss Spectra in a CdTe Crystal with a Thickness of 1 mm
Authors: Shchagin, A. V.
Kubankin, A. S.
Nazhmudinov, R. M.
Trofymenko, S. V.
Potylitsyn, Alexander Petrovich
Gogolev, Aleksey Sergeevich
Filatov, Nikolay Alexandrovich
Kube, G.
Potylitsina-Kube, N. A.
Stanitzki, M.
Diener, R.
Novokshonov, A.
Keywords: спектры; ионизационные потери; электроны; детекторы; ионизация; кремниевые кристаллы; спектры
Issue Date: 2019
Citation: Measurement of 1-GeV Electrons Ionization loss Spectra in a CdTe Crystal with a Thickness of 1 mm / A. V. Shchagin, A. S. Kubankin, R. M. Nazhmudinov [et al.] // Radiation from Relativistic Electrons in Periodic Structures (RREPS-19) : book of abstracts XIII International Symposium, September 15-20, 2019, Belgorod, Russian Federation. — Tomsk : TPU Publishing House, 2019. — [P. 110].
URI: http://earchive.tpu.ru/handle/11683/58020
Appears in Collections:Материалы конференций

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