Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/16486
Title: X-ray micro tomography of a nano-satellite
Authors: Mamyrbayev, T. A.
metadata.dc.contributor.advisor: Batranin, Andrey Viktorovich
Keywords: компьютерная томография; рентген; наноспутники; неразрушающий контроль
Issue Date: 2015
Citation: Mamyrbayev T. A. X-ray micro tomography of a nano-satellite / T. A. Mamyrbayev ; sci. ad. A. V. Batranin, lingv. T. S. Mylnikova // Иностранный язык в контексте проблем профессиональной коммуникации : материалы II Международной научной конференции , 27-29 апреля 2015 г., Томск. — Томск : Изд-во ТПУ, 2015. — [С. 82-84].
Abstract: X-ray computed tomography (CT) is being increasingly used in industry for dimensional quality control purposes. This method is applies to study the internal structure of the object and to find defects noninvasively [3, p. 495]. For this purpose, the high energy computed tomography scanner was developed at Tomsk Polytechnic University. The voltage of the system X-ray tube is 20-450 kV and the focal spot is 0.4 or 1 mm in size. The x-ray micro tomography of a nano-satellite (CubeSat) is described in this paper.
URI: http://earchive.tpu.ru/handle/11683/16486
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