Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/18104
Title: Assessment of quartz materials crystallinity by x-ray diffraction
Authors: Korovkin, Mikhail Vladimirovich
Ananieva, Ludmila Gennadievna
Nebera, T.
Antsiferova, A.
Keywords: кварцевые материалы; кристалличность; рентгеновская дифракция; кварц; кварциты; монокристаллы
Issue Date: 2016
Publisher: IOP Publishing
Citation: Assessment of quartz materials crystallinity by x-ray diffraction / M. V. Korovkin[et al.] // IOP Conference Series: Materials Science and Engineering. — 2016. — Vol. 110 : Radiation-Thermal Effects and Processes in Inorganic Materials (RTEP2015) : International Scientific Conference, 31 August to 10 September 2015, Tomsk, Russia : [proceedings]. — [012095, 4 p.].
Abstract: The estimated degree of crystallinity of natural and synthetic grown quartz and quartzite by calculating the x-ray diffraction patterns. It is shown that the index of crystallinity of natural quartzite varies widely, reflecting the different degree of their transformation. The highest values of the index of crystallinity are characterized natural and synthetic single crystals of quartz.
URI: http://earchive.tpu.ru/handle/11683/18104
Appears in Collections:Материалы конференций

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