Please use this identifier to cite or link to this item:
http://earchive.tpu.ru/handle/11683/72806| Title: | Automatic device for testing thermal resistance with thermoelectric effect |
| Authors: | Vasiljev, I. M. Soldatov, Aleksey Ivanovich Dementjev, A. A. Soldatov, Andrey Alekseevich Abouellail, Akhmed |
| Keywords: | автоматические устройства; проверки; термическое сопротивление; термоэлектрический эффект; термоинтерфейсы |
| Issue Date: | 2020 |
| Publisher: | IOP Publishing |
| Citation: | Automatic device for testing thermal resistance with thermoelectric effect / I. M. Vasiljev, A. I. Soldatov, A. A. Dementjev [et al.] // Journal of Physics: Conference Series. — Bristol : IOP Publishing, 2020. — Vol. 1499: Actual Trends in Radiophysics : International Conference 1-4 October 2019, Tomsk, Russian Federation. — [012047, 7 p.]. |
| Abstract: | This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application. |
| URI: | http://earchive.tpu.ru/handle/11683/72806 |
| Appears in Collections: | Репринты научных публикаций |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| conf-nw-36375.pdf | 929,21 kB | Adobe PDF | View/Open |
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