Please use this identifier to cite or link to this item:
http://earchive.tpu.ru/handle/11683/58020| Title: | Measurement of 1-GeV Electrons Ionization loss Spectra in a CdTe Crystal with a Thickness of 1 mm |
| Authors: | Shchagin, A. V. Kubankin, A. S. Nazhmudinov, R. M. Trofymenko, S. V. Potylitsyn, Alexander Petrovich Gogolev, Aleksey Sergeevich Filatov, Nikolay Alexandrovich Kube, G. Potylitsina-Kube, N. A. Stanitzki, M. Diener, R. Novokshonov, A. |
| Keywords: | спектры; ионизационные потери; электроны; детекторы; ионизация; кремниевые кристаллы; спектры |
| Issue Date: | 2019 |
| Citation: | Measurement of 1-GeV Electrons Ionization loss Spectra in a CdTe Crystal with a Thickness of 1 mm / A. V. Shchagin, A. S. Kubankin, R. M. Nazhmudinov [et al.] // Radiation from Relativistic Electrons in Periodic Structures (RREPS-19) : book of abstracts XIII International Symposium, September 15-20, 2019, Belgorod, Russian Federation. — Tomsk : TPU Publishing House, 2019. — [P. 110]. |
| URI: | http://earchive.tpu.ru/handle/11683/58020 |
| Appears in Collections: | Материалы конференций |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| conference_tpu-2019-C64_p110.pdf | 274,19 kB | Adobe PDF | View/Open |
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