Please use this identifier to cite or link to this item:
http://earchive.tpu.ru/handle/11683/22384| Title: | Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective |
| Authors: | Sukhikh, Leonid Grigorievich Artyukov, Igor Bajt, Sasa Kube, Gero Lauth, Werner Potylitsyn, Alexander Petrovich Vukolov, Artem Vladimirovich |
| Keywords: | измерения; свет; переходные излучения; изображения; пучки; электронные ускорители |
| Issue Date: | 2015 |
| Citation: | Micron-scale vertical beam size measurements based on transition radiation imaging with a Schwarzschild objective / L. G. Sukhikh [et al.] // RREPS-15. Radiation from Relativistic Electrons in Periodic Structures : XI International Symposium, 6-11 September 2015, Saint Petersburg, Russia. — Tomsk : TPU Publishing House, 2015. — [P. 88]. |
| URI: | http://earchive.tpu.ru/handle/11683/22384 |
| Appears in Collections: | Материалы конференций |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| conference_tpu-2015-C64-059.pdf | 77,73 kB | Adobe PDF | View/Open |
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