Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/33961
Title: Thermal damage at short electron bunches passage through a thin target
Authors: Babaev, Anton Anatoljevich
Gogolev, Aleksey Sergeevich
Keywords: тепловые повреждения; электронные сгустки; мишени; электронные лучи
Issue Date: 2016
Publisher: IOP Publishing
Citation: Babaev A. A. Thermal damage at short electron bunches passage through a thin target / A. A. Babaev, A. S. Gogolev // Journal of Physics: Conference Series. — 2016. — Vol. 732 : Radiation from Relativistic Electrons in Periodic Structures (RREPS2015) : XI International Symposium, 6–11 September 2015, Saint Petersburg, Russian Federation : [proceedings]. — [012030, 7 p.].
Abstract: The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.
URI: http://earchive.tpu.ru/handle/11683/33961
Appears in Collections:Материалы конференций

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