Please use this identifier to cite or link to this item: http://earchive.tpu.ru/handle/11683/35670
Title: Positron annihilation spectroscopy of vacancy-type defects hierarchy in submicrocrystalline nickel during annealing
Authors: Kuznetsov, Pavel Viktorovich
Mironov, Yu. P.
Tolmachev, A. I.
Rakhmatulina, T. V.
Bordulev, Yuri Sergeevich
Laptev, Roman Sergeevich
Lider, Andrey Markovich
Mikhailov, Andrey Anatolievich
Korznikov, A. V.
Keywords: submicrocrystalline structure; subgrain; grain boundary; low-angle boundary; positron annihilation; dislocations; vacancy cluster; annealing; аннигиляция; позитроны; спектроскопия; дефекты; никель; отжиг; субмикрокристаллические структуры
Issue Date: 2014
Publisher: AIP Publishing
Citation: Positron annihilation spectroscopy of vacancy-type defects hierarchy in submicrocrystalline nickel during annealing / P. V. Kuznetsov [et al.] // AIP Conference Proceedings. — 2014. — Vol. 1623 : International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk, Russia, 3–5 September 2014 : [proceedings]. — [P. 327-330].
Abstract: Positron annihilation and X-ray diffraction analysis have been used to study submicrocrystalline nickel samples prepared by equal channel angular pressing. In the as-prepared samples the positrons are trapped at dislocation-type defects and in vacancy clusters that can include up to 5 vacancies. The study has revealed that the main positron trap centers at the annealing temperature of deltaT= 20°C-180°C are low-angle boundaries enriched by impurities. At deltaT = 180°C-360°C, the trap centers are low-angle boundaries providing the grain growth due to recrystallization in-situ.
URI: http://earchive.tpu.ru/handle/11683/35670
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