Please use this identifier to cite or link to this item:
http://earchive.tpu.ru/handle/11683/14732
Title: | Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals |
Authors: | Chernyavski (Chernyavskiy), Aleksandr Viktorovich Kaz, M. S. |
Keywords: | масс-спектрометры; диффузия; щелочно-галоидные кристаллы |
Issue Date: | 2015 |
Publisher: | IOP Publishing |
Citation: | Chernyavski (Chernyavskiy) A. V. Application of secondary ion mass spectrometer for measuring the diffusion profiles in alkali-halide crystals / A. V. Chernyavski (Chernyavskiy), M. S. Kaz // IOP Conference Series: Materials Science and Engineering. — 2015. — Vol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials : International Scientific Conference, 3-8 November 2014, Tomsk, Russia : [proceedings]. — [012088, 4 p.]. |
Abstract: | Depth profiles of magnesium, fluorine and oxygen impurities was examined in the surface layers of alkali-halide KBr crystals using method of secondary ion mass spectrometry. Samples of potassium bromide, coated with a surface film of magnesium fluoride were subjected to isothermal diffusion annealing in air at various times. It is shown that the diffusion of O ions occurs from the ambient atmosphere besides the diffusion of Mg and F ions during annealing of KBr crystals. Accurate estimation of the diffusion coefficients of cationic impurity Mg requires taking into account the possible interaction of this impurity and oxygen. |
URI: | http://earchive.tpu.ru/handle/11683/14732 |
Appears in Collections: | Материалы конференций |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
012088.pdf | 756,46 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.